This package provides functions for smart sampling and sensitivity analysis for metrology applications, including computationally expensive problems.
| Version: | 1.2 |
| Depends: | R (≥ 2.7.0), DiceDesign, lhs, metRology, msm, sensitivity |
| Published: | 2014-04-17 |
| Author: | S.Demeyer, A.Allard |
| Maintainer: | Alexandre Allard <alexandre.allard at lne.fr> |
| License: | GPL-3 |
| NeedsCompilation: | no |
| CRAN checks: | ATmet results |
| Reference manual: | ATmet.pdf |
| Package source: | ATmet_1.2.tar.gz |
| Windows binaries: | r-devel: ATmet_1.2.zip, r-release: ATmet_1.2.zip, r-oldrel: ATmet_1.2.zip |
| OS X Snow Leopard binaries: | r-release: ATmet_1.2.tgz, r-oldrel: ATmet_1.2.tgz |
| OS X Mavericks binaries: | r-release: ATmet_1.2.tgz |